Albion Systems    |   home
About Albion Systems   |   News and Events   |   Contact   |    Services   |   Publications   |   Patents   |   Gallery
Publications

Links to these publications respect copyright requirements, and some may require memberships, payments, or passwords.  In case of difficulty, email us with a request for a copy.

37.  Radiation Issues Surrounding Very High Energy Ion Implantation, Nicholas White, Edward Bell, and Nobuhiro Tokoro, IIT 2008, AIP conf 1066, p.277.

36.  Chicane Deceleration - an Innovative Energy Contamination Control Technique in Low Energy Ion Implantation, N. White, J. Chen, C. Mulcahey, S. Biswas, R. Gwilliam. IIT 2006, AIP Conference Proceedings Vol 866,  p. 335

35. Advances in Optical Densitometry for Low-Dose Measurements, Ray Kuzbyt, Ron Eddy, Nicholas White, Raymond Callahan, Proc. 14th Conference on Ion Implantation Technology, Taos, New Mexico,    IEEE 02EX505, 2003.

34. New Implant Equipment for the Production of Commercial SOI Substrates. N.R. White, M. Sieradzki, E.W. Bell, 2001 IEEE International SOI Conference Proceedings,   IEEE 01CH37207, 2001, p.41.

33. An Unscanned, Mass-Analyzed Ion Implantation System for Flat-Panel Displays, S. Satoh, T. Degawa, H. Watanabe, K. Ujihara, K. Oguro, K. Shimamura, M. Ochi, T. Kawaguchi, Y. Kunitake, K. Nakajima, M. Tanaka, H. Narita, E.W. Bell, M. Sieradzki, and N.R. White, Proc. 12th International Conference on Ion Implantation Technology-98, Kyoto, Japan, IEEE98EX144, 1999, p. 138.

32. A Novel Beamline for Sub-keV Implants with Reduced Energy Contamination, Gordon Angel, Edward Bell, Douglas Brown, James Buff, James Cummings, William Edwards, Charles McKenna, Svetlana Radovanov and Nicholas R. White, Proc. 12th International Conference on Ion Implantation Technology-98, Kyoto, Japan, IEEE98EX144, 1999, p. 188.

31. Positive Control of Uniformity in Ribbon Beams for Implantation of Flat-Panel Displays, N.R. White, S. Satoh, E.W. Bell, M. Sieradzki, C. Geary, T. Degawa, K. Shimamura, M. Ochi,  Proc. 12th International Conference on Ion Implantation Technology-98, Kyoto, Japan, IEEE98EX144, 1999, p. 354.

30. Wafer Cooling for a High-Current Serial Ion Implantation System, Svetlana B. Radovanov, Steven R. Walther, Edward Evans, Jon Ballou, Nicholas R. White, and William Frutiger,  Proc. 12th International Conference on Ion Implantation Technology-98, Kyoto, Japan, IEEE98EX144, 1999, p.  634

29. The Control of Uniformity in Parallel Ribbon Ion Beams up to 24 Inches in Size, Nicholas R. White, Edward Bell, Manny Sieradzki, and Shu Satoh, Proc 15th International Conference on Application of Accelerators in Science and Industry, Denton, Texas, AIP Conference Proceedings 475, 1999, p. 830.
montblanc replica
28. Particle Transport Reduction  in a Serial High Current Implanter, Steven R. Walther, Manny Sieradzki, and Nicholas R. White, in Proc. 11th International Conference on Ion Implantation Technology-96, Austin, Texas, IEEE96TH8182, 1997, p. 170.

27. Cooled Electrostatic Chuck for High Current Serial Ion Implantation, Steven R. Walther, Jon Ballou, and Nicholas R. White, in Proc. 11th International Conference on Ion Implantation Technology-96, Austin, Texas, IEEE96TH8182, 1997, p.  260.

26. Moore's Law: Implications for Ion Impant Equipment -  An Equipment Designer's Perspective, Nicholas R. White, in Proc. 11th International Conference on Ion Implantation Technology-96, Austin, Texas, IEEE96TH8182, 1997, p. 355.

25. The Ion Beam Optics of a Single Wafer High Current Ion Implanter, Nicholas R. White, Manny Sieradzki, and Anthony Renau in Proc. 11th International Conference on Ion Implantation Technology-96, Austin, Texas, IEEE96TH8182, 1997, p. 396.

24. Serial High Current Implantation of Large Substrates, Nicholas R. White, Manny Sieradzki, and Shu Satoh, in Proc. 10th International Conference on Ion Implantation Technology-94, Catania, Italy, North Holland, 1995, p. 445

23. Fundamental Limits to Ion Beam Current Transport in Magnetic Isotope Separators and Related Systems, Nicholas R. White, Tim Grey Morgan, 18th IEEE International Conference on Plasma Science, Williamsburg, VA, 1991.

22. New Approaches to Charging Control, Julie A. Strain, Yoichiro Tanaka, Nicholas R. White, and Richard J. Woodward, in Proc. 8th International Conference on Ion Implantation Technology-90, Guildford, Surrey, UK, Nuclear Instruments and Methods B55 (1991) p. 97.

21. Ion Beam System Design for ULSI Device Requirements, Nicholas R. White,  in Proc. 8th International Conference on Ion Implantation Technology-90, Guildford, Surrey, UK, Nuclear Instruments and Methods B55 (1991) p. 287.

20. Charge Neutralization in the PI9000 series implanters, M.T. Wauk, N. White, B. Adibi, M. Current, and J. Strain,  in Proc. 8th International Conference on Ion Implantation Technology-90, Guildford, Surrey, UK, Nuclear Instruments and Methods B55 (1991) p. 413.

19. Computer Modeling for Ion Beam System Design, Hiroyuki Ito and Nicholas R. White,  in Proc. 8th International Conference on Ion Implantation Technology-90, Guildford, Surrey, UK, Nuclear Instruments and Methods B55 (1991) p. 527.
We also keep these watches entire brands: audemars piguet, bell & ross, breguet,breitling, replica watches,bvlgari, cartier, chopard, corum, franck muller, hublot,longines, richard mille replica,montblanc, movado, omega,patek philippe,iwc,panerai,porsche design,rado,richard mille,roger dubuis,rolex,tag heuer,tissot,u boat,ulysse nardin,versace,glashutte,graham jaeger lecoutre etc.

18. Ion Beam technology for Production VLSI/ULSI Semiconductor Doping, Nicholas R. White, Proc. Int. Conf Ion Implantation and Ion Beam Equipment, Elenite, Bulgaria, World Scientific, 1991, ISBN 981-02-0558-9, p.244.

17. Ion Sources for use in Ion Implantation, Nicholas R. White,  in Proc. 7th International Conference on Ion Implantation Technology, Kyoto, Japan, Nuclear Instruments and Methods B37/38 (1989) p. 78.

16. The Design of Magnets with Non-Dipole Field Components, Nicholas R. White, S. Kowalski, K. Purser, in  Nuclear Instruments and Methods A258 (1987) p. 437 .

15. Computers and the Design of Ion Beam Optical Systems, Nicholas R. White,  in Proc. 7th International Conference on Ion Implantation Technology, Berkeley, CA, USA, Nuclear Instruments and Methods B21 (1987) p. 339.

14. Wafer Charging and Beam Interactions in Ion Implantation, M.E. Mack, G. Ryding, D.H. Douglas-Hamilton, K. Steeples, M. Farley, V. Gillis, N. White, A. Wittkower, and R. Lambracht,  in Proc. 5th International Conference on Ion Implantation Technology, Smugglers Notch, VT, Nuclear Instruments and Methods B6 (1985) p. 405.

13. An Ion Beam Study of Reactive Scattering of Halide Ions by Methyl Halides, N.R. White, D. Scott, M.S. Huq, L.D. Doverspike, R.L. Champion, in J. Chem. Phys. 80 (3), 1984.

12. Measurement of the Total Cross Section for Charge Transfer and Electron Detachment of Halide Ions on Chlorine. M.S. Huq, D. Scott, N.R. White, R.L. Champion, and L.D. Doverspike, Journal of Chemical Physics (1984).

11. The Radiocarbon Facility at the Research Laboratory for Archaeology in Oxford, N.R. White, J.O. Wand, R.E.M. Hedges, E.T. Hall, Symposium on Accelerator Mass Spectrometry, Argonne National Laboratory, Argonne, Illinois, 1981.

10. The Inverted Spherical Ionizer Sputter Ion Source (IS3), Nicholas R. White, Nucl. Instr. and Meth. 206 (1983), p.15.

9. The Optics, Emittance, and Brightness of the Reflected Beam Sputter Source, N.R. White, Nucl. Instr. and Meth. 206 (1983) p.1.

8. Fractionation Corrections for Radiocarbon Dating with Accelerators, N.R. White, 21st International Symposium on Archaeometry, Brookhaven National Laboratory, NY. (1981). Also at Symposium on Accelerator Mass Spectrometry, Argonne National Laboratory, Argonne, Illinois, 1981.

7. Radiocarbon Dating by ion Counting, Proposals and Progress. R.E.M Hedges, J.O. Wand, N.R. White, E.T. Hall, Proceedings of 10th International Radiocarbon Conference, 1979, Heidelberg, Radiocarbon v22(3), (1980), p.816.

6. Ion Beam Production from Archaeological Samples for Radiocarbon Mass Spectrometry, N.R. White, J.O. Wand, R.E.M. Hedges, Progress in Scientific Dating Methods, British Museum Occasional paper No. 21 (1980), p.51.

5. Radiocarbon Mass Spectrometry, Progress at Oxford.  E.T. Hall, R.E.M. Hedges, J.O. Wand, and N.R. White, Proc. 20th International Symposium on Archaeometry, Paris (1980), p.51.

4.The production of C- beams for Radiocarbon Dating with Accelerators, R.E.M Hedges, J.O. Wand, N.R. White, Nuclear Instruments and Methods v.173 (1980), p.409.

3. Detection of 14C using a small Van de Graaf accelerator.  G. Doucas,  E. Garman, H.R.McK. Hyder, D.Sinclair, R.E.M. Hedges,  N.R. White, Nature v. 276 (1978), p.253.

2. Experiments to Establish the Design of a Dedicated Tandem Accelerator for 14C Dating at Oxford.  R.E.M. Hedges,  N.R. White, H.R.McK. Hyder, D.Sinclair, P.J. Barrett, G. Doucas, and E. Garman (1978), Proceedings of 1st Conference on Radiocarbon Dating with Accelerators, Rochester, NY.

1. Van de Graaf Mass-spectrometry and Laser Enrichment of 14C at Oxford. R.E.M. Hedges, E.T. Hall, N.R. White, H.R.McK. Hyder, D.Sinclair (1978), Proceedings of 1st Conference on Radiocarbon Dating with Accelerators, Rochester, NY.